Tag Archives: China microscopy

Unlocking the Power of SAM Microscopes: A Complete Guide

A Comprehensive Guide to Scanning Acoustic Microscopy (SAM) Scanning Acoustic Microscopy (SAM) is a powerful non-destructive testing technique widely used in various industries, particularly in microelectronics, to identify defects such as delaminations, voids, and material integrity. This guide aims to provide an in-depth understanding of SAM, covering its principles, applications, advantages, and technical specifications, drawing […]